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The Contactless Resistivity Tester is a device meant for testing electrical resistance on flat and bubble surfaces of semiconductor ingots. Measuring of the resistivity of the silicon ingots is based on the determination of magnetic energy power losses caused by eddy currents inside the ingot. It enables repidity and contactlessness of measurement and does not require special surface treatment before measurement.

■ Non-contact measurement
■Resistivity measurements by eddy current probe
■No sample preparation
■Application:
  ■multicrystal silicon Ingot/ Block /Wafer
  ■monocrystal silicon Ingot/ Wafer
■Resistivity Range:0.001-100ohm.cm
■Accuracy:2%